Park Systems Corp., the world's leading provider of atomic force microscopy (AFM) and nanoscale metrology solutions, today announced the commercial launch of the Park FX40 IR, completing the company's ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Park AFM-IR combines nanoscale infrared ...
Atomic force microscopy has long relied on the ability to acquire nanoscale chemical information while simultaneously characterizing nanomechanical properties. This article explores a new means of ...
AzoMaterials speaks to Cassandra Phillips and Qichi Hu from Bruker about how their new Resonance-Enhanced Force Volume AFM-IR technology overcomes the limitations of conventional nanoscale ...
Bruker Corporation (Nasdaq: BRKR) today announced accelerated development of its photothermal AFM-IR spectroscopy capabilities to address research challenges facing the semiconductor industry as ...
When atoms and electrons are confined to an atomically flat plane, 2D materials take on distinct properties, such as exceptional strength and conductivity, not seen in their 3D counterparts. These ...
Recipe‑based automation for atomic force microscopy (AFM) workflows ensures consistent, repeatable data acquisition, reduces operator dependency, and streamlines complex measurement routines. Bruker’s ...
GWACHEON, South Korea, May 29, 2026 /PRNewswire/ -- Park Systems Corp., the world's leading provider of atomic force microscopy (AFM) and nanoscale metrology solutions, today announced the commercial ...
Dimension IconIR to Support Critical Materials Characterization for Next-Generation Semiconductor Devices BILLERICA, Mass.--(BUSINESS WIRE)-- Bruker Corporation (BRKR) (Nasdaq: BRKR) today announced ...
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